GRATIS VERZENDING - GEEN MINIMALE AFNAME - VEILIG BETALEN - RUIME KEUZE - SCHERPE PRIJZEN

Dit product bevalt je? Geef het door!

Beschrijving

For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.

Medewerkers

Auteur Viktor Dubec

Productdetails

DUIN 3I10QI24P41

GTIN 9783838104041

Taal Engels

Pagina-aantallen 160

Product type Paperback

Maat 220 x 150 x 8  mm

Gewicht van product 229 g

Optical Testing of Semiconductor Devices under High Energy Pulses

Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses

Viktor Dubec

€ 69,88

Verkoper Dodax EU

Bezorgdatum: tussen donderdag, 5. november en maandag, 9. november

Staat Nieuw

Incl. BTW - Gratis verzenden
1
In winkelmandje plaatsen In winkelmandje plaatsen
€ 69,88
Incl. BTW - Gratis verzenden