GRATIS VERZENDING - GEEN MINIMALE AFNAME - VEILIG BETALEN - RUIME KEUZE - SCHERPE PRIJZEN

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Beschrijving

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.

Annotatie

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.

Medewerkers

Auteur Daniel Müller

Productdetails

DUIN 3NGFD9AD78E

GTIN 9783731508229

Verschijningsdatum 26.11.2018

Taal Engels

Pagina-aantallen 214

Product type Paperback

Maat 210 x 148 x 148  mm

Gewicht van product 405 g

RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

Dissertationsschrift

Daniel Müller

€ 44,48

Verkoper Dodax EU

Bezorgdatum: tussen dinsdag, 10. november en donderdag, 12. november

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